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Browsing Engineering Proceedings by Subject "Failure analysis"

Browsing Engineering Proceedings by Subject "Failure analysis"

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  • Wu, Yu-Liang; Jone, Wen-Ben (IEEE, 2008-10-01)
    MEMS (Microelectromechanical System) reliability has been a very important issue, especially for safety critical applications. Due to the diversity and multiple energy domains involved, MEMS devices are vulnerable to various ...

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