Power Analysis and Conditional Expectation of CMOS Sensors

Abstract

Our research currently focusing on image sensors predominantly the sensors implemented using CMOS (Complementary Metal Oxide Semiconductor) technology. These sensors designated as CMOS sensors which were introduced after CCD (Charge-coupled Devices) sensors since CCDs having some drawbacks in terms of its power and making cost compared to CMOS sensors. The most prominent feature of the CMOS sensors is that they can work at low voltage. CMOS sensors need only one supply voltage but CCDs require three to four which makes the cost of the CMOS sensor very low compared to CCD. In this context we concentrated on power consumption of CMOS sensors and corresponding regression analysis applied to obtain the linearity between the input voltage and the power consumed by the sensor in different technical environments. Further research includes the testing of these sensors in terms of their response with respect to the input voltage levels, temperature effects, noise and the conditional expectation among them. Along with that we are computing the parameters in order to characterize the sensor in according with the physical and the logical effects.