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Yield Analysis for Self-Repairable MEMS Devices
Wu, Yu-Liang
;
Jone, Wen-Ben
(
IEEE
,
2005-08-07
)
Design And Analysis Of Self-Repairable MEMS Accelerometer
Wu, Yu-Liang
;
Jone, Wen-Ben
(
IEEE
,
2005-10-03
)
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Author
Jone, Wen-Ben (2)
Wu, Yu-Liang (2)
Subject
Built-in self-repair (BISR) (2)
Micro-accelerometer (2)
Micro-electro-mechanical systems (MEMS) (2)
Redundancy repair (2)
Yield analysis (2)
Computer engineering (1)
Computer science (1)
Engineering (1)
Wireless communication (1)
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Date Issued
2005 (2)