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Browsing by Subject "Yield analysis"

Browsing by Subject "Yield analysis"

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  • Wu, Yu-Liang; Jone, Wen-Ben (IEEE, 2005-10-03)
    In this paper, a self-repairable MEMS (SRMEMS) accelerometer design is proposed. The accelerometer consists of (n+m) identical modules: n of them serve as the main device, while the remaining m modules act as the redundancy. ...
  • Xiong, Xingguo; Wu, Yu-Liang; Jone, Wen-Ben (Springer Netherlands, 2010-12-10)
    In this paper, a built-in self-repair technique for the MEMS comb accelerometer device is proposed. The main device of the comb accelerometer consists of n identical modules, and m modules are introduced as the redundancy. ...
  • Wu, Yu-Liang; Jone, Wen-Ben (IEEE, 2005-08-07)
    In this paper, the yield analysis for a selfrepairable MEMS (SRMEMS) accelerometer design is proposed. The accelerometer consists of(n+m) identical modules: n of them serve as the main device, while the remaining m modules ...

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