UB ScholarWorks

Browsing by Subject "Failure analysis"

Browsing by Subject "Failure analysis"

Sort by: Order: Results:

  • Wu, Yu-Liang; Jone, Wen-Ben (IEEE, 2008-10-01)
    MEMS (Microelectromechanical System) reliability has been a very important issue, especially for safety critical applications. Due to the diversity and multiple energy domains involved, MEMS devices are vulnerable to various ...

Search ScholarWorks


My Account