A Discrete Event Framework for Intelligent Inspection
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Authors
Sobh, Tarek M.
Jaynes, Chris
Henderson, Thomas C.
Issue Date
1993-05-01
Type
Article
Language
Keywords
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Abstract
We address the problem of intelligent inspection in this work. In particular, we use discrete event dynamic systems (DEDS) to guide the sensing of mechanical parts for industrial inspection.
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Citation
Publisher
IEEE
